Title:	Precise quantification of forces and charges at the atomic scale by non-contact atomic force and charge force microscopy
Authors:	Heile, Daniel
ORCID of the author:	https://orcid.org/0000-0002-2315-5633
Thesis advisor:	Prof. Dr. Michael Reichling
Thesis referee:	Dr. Clemens Barth
Abstract:	In this thesis, four major results novel to the field of NC-AFM, are introduced. First, the force curve alignment (FCA) method, a procedure facilitating the accurate and precise measurement of force curves, free from experimental artefacts and systematic error. Second, the established quantitative AFM theory exclusively considering a tip sampling path parallel to the data recording path is expanded, to describe an arbitrary tip oscillation direction with respect to the data recording path. Third, the theoretical foundation for charge force microscopy (CFM), a method for quantitatively retrieving charges from distant dependent Kelvin probe force microscopy data, is developed. Fourth, the FCA method and CFM in combination are employed experimentally on a cerium dioxide supported gold nanoparticle facilitating the quantification of its static charge state.
URL:	https://doi.org/10.48693/427 https://osnadocs.ub.uni-osnabrueck.de/handle/ds-2023111510025
Subject Keywords:	quantitative force measurement; quantitative charge measurement; Non-Contact Atomic Force Microscopy; Kelvin Probe Force Microscopy; Scanning Probe Microscopy; Atomic Force Microscopy; Charge Force Microscopy; cantilever; sampling path; inclined oscillation; cerium dioxide; gold nanoparticle; catalysis; classical electromagnetism; Finite-Element method; Solid surfaces; Solid-solid interfaces; Oxide surface; Cluster; Insulators
Issue Date:	15-Nov-2023
License name:	Attribution 3.0 Germany
License url:	http://creativecommons.org/licenses/by/3.0/de/
Type of publication:	Dissertation oder Habilitation [doctoralThesis]
Appears in Collections:	FB06 - E-Dissertationen

This item is licensed under a Creative Commons License