Advances in Structural LEED Analyses of Silicon Surfaces
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https://doi.org/10.48693/216
https://doi.org/10.48693/216
Titel: | Advances in Structural LEED Analyses of Silicon Surfaces |
Autor(en): | Bahlmann, Jascha |
Erstgutachter: | Prof. Dr. Joachim Wollschläger |
Zweitgutachter: | Prof. Dr. Simone Sanna |
Zusammenfassung: | Low-energy electron diffraction (LEED) is one possible experimental approach to determine atomic positions within the surface of crystalline surfaces. In this thesis, structural LEED analyses for the clean Si(001) surface as well as the Si(111)-(5 × 2)-Au reconstruction were performed. Additionally, the validity of the use of elastic strain energy as proposed by Keating was shown to improve the starting position for a structural analysis of covalent crystalline surfaces by LEED. Furthermore, an alternative approach to calculate the multiple scattering within the dynamical scattering theory was proposed. Thereby, LEED analyses of very large reconstructions and vicinal surfaces could become feasible. |
URL: | https://doi.org/10.48693/216 https://osnadocs.ub.uni-osnabrueck.de/handle/ds-202212097918 |
Schlagworte: | electron diffraction; silicon; structural analysis; dynamical scattering theory; silicide; LEED |
Erscheinungsdatum: | 9-Dez-2022 |
Lizenzbezeichnung: | Attribution 3.0 Germany |
URL der Lizenz: | http://creativecommons.org/licenses/by/3.0/de/ |
Publikationstyp: | Dissertation oder Habilitation [doctoralThesis] |
Enthalten in den Sammlungen: | FB06 - E-Dissertationen |
Dateien zu dieser Ressource:
Datei | Beschreibung | Größe | Format | |
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thesis_bahlmann.pdf | Präsentationsformat | 6,24 MB | Adobe PDF | thesis_bahlmann.pdf Öffnen/Anzeigen |
Diese Ressource wurde unter folgender Copyright-Bestimmung veröffentlicht: Lizenz von Creative Commons