Advances in Structural LEED Analyses of Silicon Surfaces

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https://doi.org/10.48693/216
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dc.contributor.advisorProf. Dr. Joachim Wollschlägerger
dc.creatorBahlmann, Jascha-
dc.date.accessioned2022-12-09T11:35:51Z-
dc.date.available2022-12-09T11:35:51Z-
dc.date.issued2022-12-09T11:35:51Z-
dc.identifier.urihttps://doi.org/10.48693/216-
dc.identifier.urihttps://osnadocs.ub.uni-osnabrueck.de/handle/ds-202212097918-
dc.description.abstractLow-energy electron diffraction (LEED) is one possible experimental approach to determine atomic positions within the surface of crystalline surfaces. In this thesis, structural LEED analyses for the clean Si(001) surface as well as the Si(111)-(5 × 2)-Au reconstruction were performed. Additionally, the validity of the use of elastic strain energy as proposed by Keating was shown to improve the starting position for a structural analysis of covalent crystalline surfaces by LEED. Furthermore, an alternative approach to calculate the multiple scattering within the dynamical scattering theory was proposed. Thereby, LEED analyses of very large reconstructions and vicinal surfaces could become feasible.eng
dc.rightsAttribution 3.0 Germany*
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/de/*
dc.subjectelectron diffractioneng
dc.subjectsiliconeng
dc.subjectstructural analysiseng
dc.subjectdynamical scattering theoryeng
dc.subjectsilicideeng
dc.subjectLEEDeng
dc.subject.ddc530 - Physikger
dc.titleAdvances in Structural LEED Analyses of Silicon Surfaceseng
dc.typeDissertation oder Habilitation [doctoralThesis]-
thesis.locationOsnabrück-
thesis.institutionUniversität-
thesis.typeDissertation [thesis.doctoral]-
thesis.date2022-10-07-
dc.contributor.refereeProf. Dr. Simone Sannager
Enthalten in den Sammlungen:FB06 - E-Dissertationen

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